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Mots clés
Thin films
Ferromagnetic resonance
Energy loss
AC susceptibility
Growth
Aluminum
Thin film
Silicon
Magnetization curves
Evaluation
Interface defects
Magnetic anisotropy
Raman spectroscopy
Ion beam analysis
Periodic multilayer
Topological insulators
RBS
Gallium oxide
Capillary condensation
Passivation
Acoustic propreties of solid
Adsorption
Auger electron spectroscopy AES
Diffusion
Epitaxy
17Opp
17Op
Nuclear resonance profiling NRP
Magnetic semiconductors
Silicon Carbide
Nanoparticles
Adsorbed layers
Kossel diffraction
Stable isotopic tracing
Nuclear reaction analysis
Nanostructures
Indium oxide
Hysteresis
Alloys
PIXE
2H
17O
18O
7550Ee
Rutherford backscattering spectrometry RBS
Photoluminescence
Zinc oxide
XRD
Measurement
ADSORPTION DESORPTION HYSTERESIS
Acoustic
27Alda
Metal-insulator transition
Defects
Low energy electron diffraction LEED
Silicon carbide
Ion implantation
AFM
Adsorption Isotherms
3C-SiC
Pulsed laser deposition
Transparent conductive oxide TCO
Oxidation
7630Lh
7550Pp
Ageing
8140Ef
Channeling
GaMnAs
Charge exchange
NRP
Nitridation
Gold
HfO2
Multilayer
Annealing
Nickel
Aluminium
18O resonance
Pb centers
Oxygen deficiency
XPS
Epitaxial growth
13C
Density functional theory
EPR
Al2O3
Isotopic Tracing
Alloy
Sputtering
15N
ALD
X-ray diffraction
6855Jk
Topological defects
27Ald p&α
Atomic Layer Deposition ALD
27Aldp
Silica
SiC